Institutos Universitarios

Elena María Castilla González

Predoctoral Fellow
Department of Statistics and Operations Research
School of Mathematical Sciences
Complutense University of Madrid
Rey Juan Carlos University

 

 

 

Bio

I am currently Assistant Professor at the Department of Applied Mathematics at Rey Juan Carlos University. I got my Ph.D, M.Sc. and Bachelor Degree in Mathematics and Statistics at Universidad Complutense de Madrid.

Previously I was  a Predoctoral Researcher at the Department of Statistics and Operational Research at Universidad Complutense de Madrid, supported by an FPU Grant. I got my M.Sc. and bachelor’s degree in mathematics and statistics at Universidad Complutense de Madrid.

Researcher visitor at the University of McMaster (Hamilton, Canada, 3 months) and Ioannina University (Ioannina, Greece, 2 months).

 

Research interests

My research interests include information theory, categorical data analysis, composite likelihood, logistic regression models, reliability analysis and robust statistics.

 

Latest Publications

  • N. Balakrishnan, E. CastillaN. MartinL. Pardo. Power divergence approach for one-shot device testing under competing risks. Journal of Computational and Applied Mathematics, 2023, 419. https://doi.org/10.1016/j.cam.2022.114676
  • E. Castilla, P. J. Chocano. A New Robust Approach for Multinomial Logistic Regression With Complex Design Model. IEEE Transactions on Information Theory. 2022, 68 (11), pp. 7379-7395. https://doi.org/10.1109/TIT.2022.3187063
  • E. Castilla, M. Jaenada, N. Martín, L. Pardo. Robust approach for comparing two dependent normal populations through Wald-type tests based on Rényi’s pseudodistance estimators. Statistics and Computing, 2022, 32(6), 100. https://doi.org/10.3390/e24050616
  • E. Castilla, M. Jaenada, L. Pardo. Estimation and testing on independent not identically distributed observations based on Rényi’s pseudodistances. IEEE Transactions on Information Theoryhttps://doi.org/10.1109/TIT.2022.3158308
  • N. Balakrishnan, E. Castilla, M. H. Ling. Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis. Quality and Reliability Engineering International. 2022, 38, 989-1012. https://doi.org/10.1002/qre.3031
  • N. Balakrishnan, E. Castilla. EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan. Quality and Reliability Engineering International. 2022, 38, 780-799. https://doi.org/10.1002/qre.3014
  • E. Castilla, N. Martín, L. Pardo. Testing linear hypotheses in logistic regression analysis with complex sample survey data based on phi-divergence measures. Communications in Statistics - Theory and Methods. 2021, 50, 22, 5228-5247. https://doi.org/10.1080/03610926.2020.1746342
  • E. Castilla, K. Zografos. On distance-type Gaussian estimation. Journal of Multivariate Analysis. 2021, Article number 104831. https://doi.org/10.1016/j.jmva.2021.104831
  • E. Castilla, A. Ghosh, N. Martín, L. Pardo. Robust semiparametric inference for polytomous logistic regression with complex survey design. Advances in Data Analysis and Classification. 2021, 15, 701 – 734. https://doi.org/10.1007/s11634-020-00430-7

  • N. Balakrishnan, E. Castilla, N. Martin, L. Pardo. Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test. IEEE Transactions on Reliability. 2021, 70, 4, 1355-1367https://doi.org/10.1109/TR.2021.3062289
  • E. Castilla, N. Martín, L. Pardo, K. Zografos. Model Selection in a Composite Likelihood Framework Based on Density Power Divergence. Entropy. 2020, 22(3), 270. https://doi.org/10.3390/e22030270
  • E. Castilla, N. Martın, L. Pardo. Testing linear hypotheses in logistic regression analysis with complex sample survey data based on phi-divergence measures. Communications in Statistics - Theory and Methods. 2020. https://doi.org/10.1080/03610926.2020.1746342
  • N. Balakrishnan, E. Castilla, N. Martín, L. Pardo. Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model. IEEE TRANSACTIONS ON RELIABILITY. 2020, 
  • E. Castilla, N. Martín, S. Muñoz, L. Pardo. Robust Wald-type tests based on minimum Rényi pseudodistance estimators for the multiple linear regression model. Journal of Statistical Computation and Simulation. 2020, 90, 14. https://doi.org/10.1080/00949655.2020.1787410
  • N. Balakrishnan, E. Castilla, N. Martín, L. Pardo. Robust inference for one-shot device testing data under
    exponential lifetime model with multiple stresses. Qual Reliab Engng Int. 2020, 1–15. https://doi.org/10.1002/qre.2665