Héctor Canabal  Research IDs links: 

• Google Scholar
• ORCID
• UCM

 

PDF de algunos artículos :

• Automatic processing in moiré deflectometry by local fringe direction calculation, 
  Applied Optics, 37, 25, 5894-5901 (1998).

• Improved phase-shifting method for automatic processing of moiré deflectograms, 
  Applied Optics, 37, 26, 6227-6233  (1998)

• A generalization of the Prentice’s  law, 
  Journal of Ophtalmic and Physiological Optics, 18, 6, 514-520 (1998).

• Phase extraction methods for analysis of crossed fringe patterns, 
  Proc. SPIE 3744,  “Interferometry 99: Techniques and Technologies”, 231-240. (1999)

• Enhancement of surface inspection by moiré interferometry using flexible reference gratings,
  Opt. Express 8, 642-647 (2001). Link to OpticsExpress (with video)

• Laser beam deflectometry based on a subpixel resolution algorithm,
  Optical Engineering, 40 (11), 2517-2523 (2001).

• Automatic wavefront measurement technique using a computer display and a ccd camera, 
  Optical Engineering,  41 (4), 822-826 (2002).

 

PATENTES

• PROCEDIMIENTO Y SISTEMA DE SELECCIÓN DE ILUMINACIÓN EN SUPERFICIES POLÍCROMAS, Y DISPOSITIVO DE APLICACIÓN (LLEDÓ ILUMINACIÓN S.A.)
• LIGHTING SYSTEM AND METHOD (SYSTÈME ET PROCÉDÉ D'ÉCLAIRAGE)  (VALEO VISION) 
• DEVICE FOR OPTICAL CHARACTERIZATION USING AUTOMATICALLY CONTROLLED IMAGE (B2)

 

Congresos 

• Medición automática de focales locales de objetos de fase por Deflectometría Moiré
• Automatic measurements of paraxial focal distances in ophthalmic lenses by Moiré Deflectometry
• Local Fringe Direction calculation and application in Moiré Deflectometry
• Una generalización de la ley de Prentice para lentes oftálmicas con superficies ópticas asféricas
• Procesado de deflectogramas moiré aplicado a la caracterización de lentes oftálmicas
• Ophthalmic lens characterization by moiré deflectometry with squared gratings
• Phase extraction methods for analysis of crossed fringe patterns
• Sistemas de metrología óptica industrial basados en dispositivos CCD
• Sensores ópticos para el desarrollo y control industrial D
• Deflectometría Láser directa con algoritmos de resolución sub-pixel
• Shadow-Moiré and the use of flexible gratings to adapt to curved surfaces
• Cámaras ccd: control automático y resolución sub-pixel.
• In-line detection and evaluation of surface defects on thin metallic wires
• Detection of micro-bumps in aeronautic surfaces by means of an elastical moiré system
• Wavefront measurement technique by analyzing patterns displayed on a monitor
• Automatic system for surface inspection by shadow moiré technique
• Structured light-based NDT techniques of interest in the aerospace industry
• Simulación de la distribución espacial de luminancia en rótulos luminosos con leds.
• Point to point multispectral light projection applied to cultural heritage.